TY - JOUR
T1 - Investigation on laser-induced effects in nanostructure fabrication with laser-irradiated scanning tunneling microscope tips in air ambient
AU - Mai, Z. H.
AU - Lu, Y. F.
AU - Song, W. D.
AU - Chim, W. K.
N1 - Funding Information:
The authors thank Ms. H. L. Koh and Mr. Y. W. Goh for their kind help in installation of the SPM system and other facilities in our experiments. The work was supported by National University of Singapore under grant No. RP3972692.
PY - 2000
Y1 - 2000
N2 - In this paper, we report our investigation on the kinetics of nanostructure fabrication on gold films and on H-passivated Ge surfaces. The relationship between the current and the tip-sample distance of the STM junction was measured for both gold films and H-passivated Ge surfaces. The tip-sample distance for gold films under a electrochemically etched W tip is approximately 2 nm, while that for H-passivated Ge sufaces is more than 27 nm. The thermal expansion length of the tip under laser irradiation was calculated. From the comparison of the thermal expansion length and the tip-sample distance, we can reach the conclusion that for gold films, thermal mechanical indention is the primary reason of nanostructure formation, while for H-passivated Ge surfaces, optical enhancement is the only reason.
AB - In this paper, we report our investigation on the kinetics of nanostructure fabrication on gold films and on H-passivated Ge surfaces. The relationship between the current and the tip-sample distance of the STM junction was measured for both gold films and H-passivated Ge surfaces. The tip-sample distance for gold films under a electrochemically etched W tip is approximately 2 nm, while that for H-passivated Ge sufaces is more than 27 nm. The thermal expansion length of the tip under laser irradiation was calculated. From the comparison of the thermal expansion length and the tip-sample distance, we can reach the conclusion that for gold films, thermal mechanical indention is the primary reason of nanostructure formation, while for H-passivated Ge surfaces, optical enhancement is the only reason.
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U2 - 10.1557/proc-617-j3.8
DO - 10.1557/proc-617-j3.8
M3 - Conference article
AN - SCOPUS:0034439846
SN - 0272-9172
VL - 617
SP - J381-J386
JO - Materials Research Society Symposium - Proceedings
JF - Materials Research Society Symposium - Proceedings
T2 - Laser-Solid Interactions for Materials Processing
Y2 - 25 April 2000 through 27 April 2000
ER -