Ion beam assisted growth of sculptured thin films: Structure alignment and optical fingerprints

Eva Schubert, F. Frost, H. Neumann, B. Rauschenbach, B. Fuhrmann, F. Heyroth, J. Rivory, E. Charron, B. Gallas, M. Schubert

Research output: Chapter in Book/Report/Conference proceedingChapter

8 Scopus citations

Abstract

Sculptured thin films from are grown by ion beam assisted deposition under conditions with very oblique angles of incidence for the particle flux. The nanodimensional structures within the sculptured thin films are designed in geometries of columns, chevrons, left-handed multi-fold and continuous screws, and comprise non-chiral and chiral properties. The growth is studied with emphasis on self-controlled process driven structure alignment across the substrate. Intriguing optical fingerprints from the various types of sculptured thin films are highlighted by reflection-type single-wavelength generalized Mueller matrix ellipsometry and spectrally-integrated diffracted light scattering intensity measurement scans. We suggest the ellipsometry approach for chirality assessment, and suggest possible applications of the sculptured thin films in sub-wavelength nanodiffractive structures, for example.

Original languageEnglish (US)
Title of host publicationAdvances in Solid State Physics
EditorsRolf Haug
Pages309-320
Number of pages12
DOIs
StatePublished - 2007

Publication series

NameAdvances in Solid State Physics
Volume46
ISSN (Print)1438-4329

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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