IR-VUV dielectric function of Al_1-xIn_xN determined by spectroscopic ellipsometry

Material Science

• Film 100%
• Dielectric Material 100%
• Optical Property 50%
• Film Growth 50%
• Sapphire 50%
• Buffer Layer 50%

Engineering

• Spectral Range 100%
• Dielectric Function 100%
• Plane Strain 50%
• Sapphire Substrate 50%
• Buffer Layer 50%

Keyphrases

• Grille 50%
• AlInN 50%
• In-plane Strain 50%