L10 ordered FePt:C composite films with (001) texture

M. L. Yan; R. F. Sabirianov; Y. F. Xu; X. Z. Li; D. J. Sellmyer

doi:10.1109/TMAG.2004.830181

L1₀ ordered FePt:C composite films with (001) texture

M. L. Yan, R. F. Sabirianov, Y. F. Xu, X. Z. Li, D. J. Sellmyer

Research output: Contribution to journal › Article › peer-review

49 Scopus citations

Abstract

Highly textured (001) FePt:C nanocomposite thin films, deposited directly on thermally oxidized Si wafers, are obtained by multilayer deposition plus subsequent thermal annealing. Nanostructures, crystalline orientations, interactions, and magnetic properties are investigated by transmission electron microscopy (TEM), X-ray diffraction (XRD), magnetic force microscopy, and magnetic measurements. The formation of the ordered L1₀ phase is confirmed by XRD, and only visible (OOℓ) peaks indicate a high degree of the (001) texture. TEM observation reveals that FePt grains are embedded in the C matrix and appear to be well isolated. The FePt grains are very uniform with average sizes about 5 nm.

Original language	English (US)
Pages (from-to)	2470-2472
Number of pages	3
Journal	IEEE Transactions on Magnetics
Volume	40
Issue number	4 II
DOIs	https://doi.org/10.1109/TMAG.2004.830181
State	Published - Jul 2004

Keywords

FePt thin films
L1
Magnetic recording

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Access to Document

10.1109/TMAG.2004.830181

Cite this

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title = "L10 ordered FePt:C composite films with (001) texture",

abstract = "Highly textured (001) FePt:C nanocomposite thin films, deposited directly on thermally oxidized Si wafers, are obtained by multilayer deposition plus subsequent thermal annealing. Nanostructures, crystalline orientations, interactions, and magnetic properties are investigated by transmission electron microscopy (TEM), X-ray diffraction (XRD), magnetic force microscopy, and magnetic measurements. The formation of the ordered L10 phase is confirmed by XRD, and only visible (OOℓ) peaks indicate a high degree of the (001) texture. TEM observation reveals that FePt grains are embedded in the C matrix and appear to be well isolated. The FePt grains are very uniform with average sizes about 5 nm.",

keywords = "FePt thin films, L1, Magnetic recording",

author = "Yan, {M. L.} and Sabirianov, {R. F.} and Xu, {Y. F.} and Li, {X. Z.} and Sellmyer, {D. J.}",

note = "Funding Information: Manuscript received October 12, 2003. This work was supported in part by the National Science Foundation Materials Research Science and Engineering Center under Grant DMR-0213808), in part by the Information Storage Industry Consortium, in part by the National Institute of Standards and Technology, and in part by the University of Nebraska Center for Materials Research and Analysis.",

year = "2004",

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doi = "10.1109/TMAG.2004.830181",

language = "English (US)",

volume = "40",

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journal = "IEEE Transactions on Magnetics",

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publisher = "Institute of Electrical and Electronics Engineers Inc.",

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T1 - L10 ordered FePt:C composite films with (001) texture

AU - Yan, M. L.

AU - Sabirianov, R. F.

AU - Xu, Y. F.

AU - Li, X. Z.

AU - Sellmyer, D. J.

N1 - Funding Information: Manuscript received October 12, 2003. This work was supported in part by the National Science Foundation Materials Research Science and Engineering Center under Grant DMR-0213808), in part by the Information Storage Industry Consortium, in part by the National Institute of Standards and Technology, and in part by the University of Nebraska Center for Materials Research and Analysis.

PY - 2004/7

Y1 - 2004/7

N2 - Highly textured (001) FePt:C nanocomposite thin films, deposited directly on thermally oxidized Si wafers, are obtained by multilayer deposition plus subsequent thermal annealing. Nanostructures, crystalline orientations, interactions, and magnetic properties are investigated by transmission electron microscopy (TEM), X-ray diffraction (XRD), magnetic force microscopy, and magnetic measurements. The formation of the ordered L10 phase is confirmed by XRD, and only visible (OOℓ) peaks indicate a high degree of the (001) texture. TEM observation reveals that FePt grains are embedded in the C matrix and appear to be well isolated. The FePt grains are very uniform with average sizes about 5 nm.

AB - Highly textured (001) FePt:C nanocomposite thin films, deposited directly on thermally oxidized Si wafers, are obtained by multilayer deposition plus subsequent thermal annealing. Nanostructures, crystalline orientations, interactions, and magnetic properties are investigated by transmission electron microscopy (TEM), X-ray diffraction (XRD), magnetic force microscopy, and magnetic measurements. The formation of the ordered L10 phase is confirmed by XRD, and only visible (OOℓ) peaks indicate a high degree of the (001) texture. TEM observation reveals that FePt grains are embedded in the C matrix and appear to be well isolated. The FePt grains are very uniform with average sizes about 5 nm.

KW - FePt thin films

KW - L1

KW - Magnetic recording

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