Laser-driven electron beams with ultra-low emittance measured via inverse-compton-scattered X-rays

Grigory Golovin, Sudeep Banerjee, Cheng Liu, Shouyuan Chen, Jun Zhang, Baozhen Zhao, Ping Zhang, Matthew Veale, Matthew Wilson, Paul Seller, Donald Umstadter

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report results of a novel, non-destructive, and single-shot technique to measure the quality of laser-wakefield-accelerated electron beams. The technique is based on spectroscopic imaging of inverse-Compton-scattered x-rays. Record-low transverse electron-beam emittance was measured: 0.15(±0.06)p-mm-mrad.

Original languageEnglish (US)
Title of host publicationHigh Intensity Lasers and High Field Phenomena, HILAS 2016
PublisherOSA - The Optical Society
ISBN (Print)9781943580095
DOIs
StatePublished - Mar 14 2016
EventHigh Intensity Lasers and High Field Phenomena, HILAS 2016 - Long Beach, United States
Duration: Mar 20 2016Mar 22 2016

Publication series

NameOptics InfoBase Conference Papers

Other

OtherHigh Intensity Lasers and High Field Phenomena, HILAS 2016
CountryUnited States
CityLong Beach
Period3/20/163/22/16

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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  • Cite this

    Golovin, G., Banerjee, S., Liu, C., Chen, S., Zhang, J., Zhao, B., Zhang, P., Veale, M., Wilson, M., Seller, P., & Umstadter, D. (2016). Laser-driven electron beams with ultra-low emittance measured via inverse-compton-scattered X-rays. In High Intensity Lasers and High Field Phenomena, HILAS 2016 (Optics InfoBase Conference Papers). OSA - The Optical Society. https://doi.org/10.1364/HILAS.2016.HM3B.4.pdf