Laser micro-bumping and contamination-free tagging on magnetic hard disk surfaces, techniques and applications

Daming Liu, Teng Soon Wee, Yuan Yuan, Yong Feng Lu, Minghui Hong, Ryan Goh

Research output: Contribution to journalConference article

Abstract

Laser micro-bumping and contamination-free tagging magnetic hard disk surfaces had been intensively investigated. Diode-pumped Nd:YVO4 laser with fundamental output was used for micro-bumping on NiP surface and contamination-free tagging on finished disk surface. Atomic force microscopy and Auger electron spectroscopy were employed to analyse processed samples. Processing results versus laser parameters were studied and optimized in detail. Based on the research, the techniques were commercialized subsequently. In this paper, we present our experimental results and introduce their applications.

Original languageEnglish (US)
Pages (from-to)359-362
Number of pages4
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4426
DOIs
StatePublished - 2002
EventSecond International Symposium on Laser Precision Microfabrication - Singapore, Singapore
Duration: May 16 2001May 18 2001

Keywords

  • Laser contamination-free tagging
  • Laser micro-bumping
  • Magnetic hard disk

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Laser micro-bumping and contamination-free tagging on magnetic hard disk surfaces, techniques and applications'. Together they form a unique fingerprint.

  • Cite this