Abstract
Laser micro-bumping and contamination-free tagging magnetic hard disk surfaces had been intensively investigated. Diode-pumped Nd:YVO4 laser with fundamental output was used for micro-bumping on NiP surface and contamination-free tagging on finished disk surface. Atomic force microscopy and Auger electron spectroscopy were employed to analyse processed samples. Processing results versus laser parameters were studied and optimized in detail. Based on the research, the techniques were commercialized subsequently. In this paper, we present our experimental results and introduce their applications.
Original language | English (US) |
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Pages (from-to) | 359-362 |
Number of pages | 4 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 4426 |
DOIs | |
State | Published - 2002 |
Externally published | Yes |
Event | Second International Symposium on Laser Precision Microfabrication - Singapore, Singapore Duration: May 16 2001 → May 18 2001 |
Keywords
- Laser contamination-free tagging
- Laser micro-bumping
- Magnetic hard disk
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering