Laser nano-engineering with the assistance of scanning probe microscope and optical resonance in microparticles

Y. F. Lu, B. Hu, Z. H. Mai, S. M. Huang, L. Zhang, Y. W. Zheng, B. S. Luk'yanchuk, W. D. Song, M. H. Hong, T. C. Chong

Research output: Contribution to conferencePaper

Abstract

A study on laser nano-engineering using scanning probe microscope and optical resonance in microparticles was presented. Optical and thermal processes of an STM junction under laser irradiation were described. A model for the near field of a tip under polarized laser irradiation was presented. Laser-induced nanooxidation was investigated on H-passivated p-type Ge and n-type Si surfaces under electrochemically etched tungsten STM tips in air ambient. Field emission scanning electron microscopy (SEM) was used to locate the black spots that were corresponding to the original particle position.

Original languageEnglish (US)
PagesI30-I31
StatePublished - 2001
Event4th Pacific Rim Conference on Lasers and Electro-Optics - Chiba, Japan
Duration: Jul 15 2001Jul 19 2001

Conference

Conference4th Pacific Rim Conference on Lasers and Electro-Optics
CountryJapan
CityChiba
Period7/15/017/19/01

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Laser nano-engineering with the assistance of scanning probe microscope and optical resonance in microparticles'. Together they form a unique fingerprint.

  • Cite this

    Lu, Y. F., Hu, B., Mai, Z. H., Huang, S. M., Zhang, L., Zheng, Y. W., Luk'yanchuk, B. S., Song, W. D., Hong, M. H., & Chong, T. C. (2001). Laser nano-engineering with the assistance of scanning probe microscope and optical resonance in microparticles. I30-I31. Paper presented at 4th Pacific Rim Conference on Lasers and Electro-Optics, Chiba, Japan.