TY - GEN
T1 - Laser nanofabrication beyond the diffraction limit
AU - Lu, Y. F.
PY - 2005
Y1 - 2005
N2 - Laser material processing demonstrated its significance in many areas such as microelectronics, data storage, photonics and nanotechnology, since versatile laser sources provide flexible and unique energy source for precise control of material processing. To achieve nanoscale laser material machining and processing, we need to overcome the diffraction limit of the laser wavelengths. Recently, different approaches have been explored to overcome the diffraction limit and to achieve feature sizes down to 10 nm order, way beyond the diffraction limits. This paper will provide an overview in the areas of laser-based nanoscale machining and processing, including the author's own research experience on laser-assisted scanning probe microscope, superfocusing by optical resonance in spherical particles, laser nanoimprinting, laser synthesis of quantum dots, laser annealing of ultrashow pn junctions, nanometer-order film thickness detection using rotational Raman spectroscopy, and laser cleaning of nanoparticles.
AB - Laser material processing demonstrated its significance in many areas such as microelectronics, data storage, photonics and nanotechnology, since versatile laser sources provide flexible and unique energy source for precise control of material processing. To achieve nanoscale laser material machining and processing, we need to overcome the diffraction limit of the laser wavelengths. Recently, different approaches have been explored to overcome the diffraction limit and to achieve feature sizes down to 10 nm order, way beyond the diffraction limits. This paper will provide an overview in the areas of laser-based nanoscale machining and processing, including the author's own research experience on laser-assisted scanning probe microscope, superfocusing by optical resonance in spherical particles, laser nanoimprinting, laser synthesis of quantum dots, laser annealing of ultrashow pn junctions, nanometer-order film thickness detection using rotational Raman spectroscopy, and laser cleaning of nanoparticles.
UR - http://www.scopus.com/inward/record.url?scp=84899985034&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84899985034&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84899985034
SN - 1557527709
SN - 9781557527707
T3 - Optics InfoBase Conference Papers
BT - Photonic Applications Systems Technologies Conference, PhAST 2005
PB - Optical Society of America
T2 - Photonic Applications Systems Technologies Conference, PhAST 2005
Y2 - 23 May 2005 through 23 May 2005
ER -