Abstract
Planar optical waveguides have been formed in SIMOX structures, and the effect of the thickness of the buried oxide layer on propagation loss has been studied. Waveguides with guiding layer thickness of approximately 6 μm, have been measured, and a lowest loss, which is of the order of that of pure silicon, was observed for a buried oxide thickness of 0.4 μm, at a measurement wavelength of 1.523 μm,.
Original language | English (US) |
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Pages (from-to) | 633-635 |
Number of pages | 3 |
Journal | IEEE Photonics Technology Letters |
Volume | 4 |
Issue number | 6 |
DOIs | |
State | Published - Jun 1992 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering