TY - GEN
T1 - Measuring ultralow emittance of laser-driven electron beams with spectroscopic imaging of inverse-Compton scattered x-rays
AU - Golovin, G.
AU - Banerjee, S.
AU - Liu, C.
AU - Chen, S.
AU - Zhang, J.
AU - Zhao, B.
AU - Zhang, P.
AU - Veale, M.
AU - Wilson, M.
AU - Seller, P.
AU - Umstadter, D.
N1 - Publisher Copyright:
© OSA 2016.
PY - 2014/7/21
Y1 - 2014/7/21
N2 - We report the first measurement of laser-wakefield-accelerated electron beam transverse emittance, as well as its evolution, performed via a novel, non-destructive, and singleshot technique employing spectroscopic imaging of x-rays produced by inverse-Compton scattering.
AB - We report the first measurement of laser-wakefield-accelerated electron beam transverse emittance, as well as its evolution, performed via a novel, non-destructive, and singleshot technique employing spectroscopic imaging of x-rays produced by inverse-Compton scattering.
UR - http://www.scopus.com/inward/record.url?scp=85019526888&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85019526888&partnerID=8YFLogxK
U2 - 10.1364/FIO.2016.FTu1C.3
DO - 10.1364/FIO.2016.FTu1C.3
M3 - Conference contribution
AN - SCOPUS:85019526888
SN - 9781943580194
T3 - Optics InfoBase Conference Papers
BT - Frontiers in Optics, FiO 2016
PB - OSA - The Optical Society
T2 - Frontiers in Optics, FiO 2016
Y2 - 17 October 2016 through 21 October 2016
ER -