Microcantilever torque magnetometry study of patterned magnetic films

L. Yuan, L. Gao, R. Sabirianov, S. H. Liou, M. D. Chabot, D. H. Min, J. Moreland, Bao Shan Han

Research output: Contribution to journalArticle

2 Scopus citations

Abstract

Microcantilever torque magnetometry (MTM) is a sensitive tool to measure small magnetization changes in the sample. In this paper, we investigated a process for preparing patterned magnetic films on cantilevers and studied the magnetic interactions of a single pair of micrometer-sized Ni 80Fe20 bars (7 μm × 3.5 μm × 30 nm) separated by 50 nm using MTM. The bars were prepared with focused ion-beam milling. The magnetic hysteresis loops show that the switching field of a single bar is larger than the reversing field of only one of the paired bars and less than that of both paired bars. This clearly indicates that the magnetostatic interaction exists between the bars.

Original languageEnglish (US)
Pages (from-to)3234-3236
Number of pages3
JournalIEEE Transactions on Magnetics
Volume42
Issue number10
DOIs
StatePublished - Oct 2006

Keywords

  • Magnetization reversal
  • Torque magnetometers

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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