Model-based frequency response characterization of a digital-image analysis system for epifluorescence microscopy

Rajeeb Hazra; Charles L. Viles; Stephen K. Park; Stephen E. Reichenbach; Michael E. Sieracki

doi:10.1364/AO.31.001083

Model-based frequency response characterization of a digital-image analysis system for epifluorescence microscopy

Rajeeb Hazra, Charles L. Viles, Stephen K. Park, Stephen E. Reichenbach, Michael E. Sieracki

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

We describe a model-based method for estimating the spatial frequency response of a digital-imaging system (e.g., a CCD camera) that is modeled as a linear, shift-invariant image acquisition subsystem that is cascaded with a linear, shift-variant sampling subsystem. The method characterizes the twodimensional frequency response of the image acquisition subsystem to beyond the Nyquist frequency by accounting explicitly for insufficient sampling and the sample-scene phase. Results for simulated systems and a real CCD-based epifluorescence microscopy system are presented to demonstrate the accuracy of the method.

Original language	English (US)
Pages (from-to)	1083-1092
Number of pages	10
Journal	Applied optics
Volume	31
Issue number	8
DOIs	https://doi.org/10.1364/AO.31.001083
State	Published - Mar 1992
Externally published	Yes

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Engineering (miscellaneous)
Electrical and Electronic Engineering

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10.1364/AO.31.001083

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abstract = "We describe a model-based method for estimating the spatial frequency response of a digital-imaging system (e.g., a CCD camera) that is modeled as a linear, shift-invariant image acquisition subsystem that is cascaded with a linear, shift-variant sampling subsystem. The method characterizes the twodimensional frequency response of the image acquisition subsystem to beyond the Nyquist frequency by accounting explicitly for insufficient sampling and the sample-scene phase. Results for simulated systems and a real CCD-based epifluorescence microscopy system are presented to demonstrate the accuracy of the method.",

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AU - Viles, Charles L.

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AU - Reichenbach, Stephen E.

AU - Sieracki, Michael E.

PY - 1992/3

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AB - We describe a model-based method for estimating the spatial frequency response of a digital-imaging system (e.g., a CCD camera) that is modeled as a linear, shift-invariant image acquisition subsystem that is cascaded with a linear, shift-variant sampling subsystem. The method characterizes the twodimensional frequency response of the image acquisition subsystem to beyond the Nyquist frequency by accounting explicitly for insufficient sampling and the sample-scene phase. Results for simulated systems and a real CCD-based epifluorescence microscopy system are presented to demonstrate the accuracy of the method.

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Model-based frequency response characterization of a digital-image analysis system for epifluorescence microscopy

Abstract

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