Modifications in the unit cell geometry of sputtered niobium films caused by high energy ion bombardment

D. M. Pease, F. Namavar, J. Budnick, M. Choi, J. Groeger, F. A. Otter, Y. Bruynseraede, M. Clapp

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Fingerprint

Dive into the research topics of 'Modifications in the unit cell geometry of sputtered niobium films caused by high energy ion bombardment'. Together they form a unique fingerprint.

Keyphrases

Engineering