Multiple-layered effective medium approximation approach to modeling environmental effects on alumina passivated highly porous silicon nanostructured thin films measured by in-situ Mueller matrix ellipsometry

Alyssa Mock, Timothy Carlson, Jeremy VanDerslice, Joel Mohrmann, John A. Woollam, Eva Schubert, Mathias Schubert

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

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Chemical Engineering

Engineering

Material Science