TY - GEN
T1 - Nano electro-machining (nano-EM)
T2 - 41st Annual International Symposium on Microelectronics, IMAPS 2008
AU - Malshe, Ajay P.
AU - Virwani, Kumar R.
AU - Kalyanasundaram, Valliappa
AU - Rajurkar, Kamlakar P.
PY - 2008
Y1 - 2008
N2 - There is a great need to produce nanoscale features on diverse and sometimes difficult-to-machine materials for electronic and bio-medical applications. This paper describes an electro-machining (EM) process at nanoscale, implemented using a scanning probe platinum-iridium (Pt-Ir) electrode tool (15-20 nm radius) in dielectric oil. The experiments were conducted by maintaining a gap of 2 nm between the tool and the work-piece. These experiments have successfully demonstrated that controlled and consistent machined features, as small as 10 nm in diameter, on atomically flat gold can be obtained. It is suggested that resonant tunnelling through dielectric oil molecules causes the removal of material.
AB - There is a great need to produce nanoscale features on diverse and sometimes difficult-to-machine materials for electronic and bio-medical applications. This paper describes an electro-machining (EM) process at nanoscale, implemented using a scanning probe platinum-iridium (Pt-Ir) electrode tool (15-20 nm radius) in dielectric oil. The experiments were conducted by maintaining a gap of 2 nm between the tool and the work-piece. These experiments have successfully demonstrated that controlled and consistent machined features, as small as 10 nm in diameter, on atomically flat gold can be obtained. It is suggested that resonant tunnelling through dielectric oil molecules causes the removal of material.
KW - Electrical discharge machining
KW - Nanoscale
KW - Scanning tunneling microscope
UR - http://www.scopus.com/inward/record.url?scp=84876920810&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84876920810&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84876920810
SN - 0930815866
SN - 9780930815868
T3 - Proceedings - 2008 International Symposium on Microelectronics, IMAPS 2008
SP - 527
EP - 532
BT - Proceedings - 2008 International Symposium on Microelectronics, IMAPS 2008
Y2 - 2 November 2008 through 6 November 2008
ER -