We report on nonepitaxially grown L 10 Cu-alloyed FePt thin films with strong (001) texture. The FePt films with different Cu contents were deposited directly on Si wafers with a Fe49 Pt51 Cu multilayer structure. The Cu content was varied from 0 to 13 at. %. All films were annealed at 600 °C for 5 min. X-ray-diffraction characterization showed that only one set of L 10 diffraction peaks appeared and no elemental Cu diffraction peaks were visible. This result, along with a varying ca lattice-parameter ratio, suggests that Cu substitutes Fe or Pt in the L 10 lattice and ternary FePtCu alloy films are formed. (001) texture was enhanced with the increase of Cu content. Transmission electron microscope images showed that the grain size of FePtCu was about 10 nm. For FePt film with 11 at. % Cu substitution, coercivity was about 5 kOe, which is suitable for writing in a practical perpendicular-recording film.
ASJC Scopus subject areas
- Physics and Astronomy(all)