Neutralization process of Xeq+ ion grazing on Al(111) surface

Bi Tao Hu, Hong Jun Zhang, Jian Zhang, Yu Shou Song, Li Li Wang, Chun Hua Chen, Jian Gan Gu

Research output: Contribution to journalArticle

2 Scopus citations

Abstract

A code has been developed to simulate the neutralization and grazing process of slow highly charged ion Xeq+ on Al(111) surface under the classical-over-the-barrier model. The image energy gain of Xeq+ ions are calculated and compared with experiment data. The simulation results of image energy gain are in good agreement with the experiment data. Meanwhile, in the present work, the reflection coefficient of incident Xeq+ on Al(111) surface as a function of the incidence angle, energy and charge state is also studied.

Original languageEnglish (US)
Pages (from-to)2918-2923
Number of pages6
JournalChinese Physics
Volume16
Issue number10
DOIs
StatePublished - Oct 1 2007

Keywords

  • Grazing incidence
  • Hollow atom
  • Slow highly charged ion

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Hu, B. T., Zhang, H. J., Zhang, J., Song, Y. S., Wang, L. L., Chen, C. H., & Gu, J. G. (2007). Neutralization process of Xeq+ ion grazing on Al(111) surface. Chinese Physics, 16(10), 2918-2923. https://doi.org/10.1088/1009-1963/16/10/016