Non-epitaxial, highly textured (001) CoPt:B2O3 composite films for perpendicular recording

M. L. Yan; N. Powers; D. J. Sellmyer

doi:10.1557/proc-721-e7.6

Non-epitaxial, highly textured (001) CoPt:B₂O₃ composite films for perpendicular recording

M. L. Yan, N. Powers, D. J. Sellmyer

Physics and Astronomy

Research output: Contribution to journal › Conference article › peer-review

6 Scopus citations

Abstract

We report the non-epitaxial growth of highly textured (001) CoPt:B₂O₃ nanocomposite thin films that are deposited directly on thermally-oxidized Si wafers. Multilayers of Co/Pt/Co/B₂O₃ are deposited followed by appropriate thermal processing. The as-deposited films are disordered fcc CoPt phase, and magnetically soft. After annealing, an (001) orientation of CoPt-ordered grains is developed. The texture development is dependent both on the total film thickness and the annealing process. Nearly perfect (001) texture can be obtained in films with thinner initial layer thicknesses. Strong perpendicular anisotropy is shown to be related to this (001) texture.

Original language	English (US)
Pages (from-to)	291-295
Number of pages	5
Journal	Materials Research Society Symposium - Proceedings
Volume	721
DOIs	https://doi.org/10.1557/proc-721-e7.6
State	Published - 2002
Event	Magnetic and Electronic Films - Microstructure, Texture and Application to Data Storage - San Francisco, United States Duration: Apr 1 2002 → Apr 4 2002

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Access to Document

10.1557/proc-721-e7.6

Cite this

@article{66c4e8e8512d43519eed16b6f864d7ba,

title = "Non-epitaxial, highly textured (001) CoPt:B2O3 composite films for perpendicular recording",

abstract = "We report the non-epitaxial growth of highly textured (001) CoPt:B2O3 nanocomposite thin films that are deposited directly on thermally-oxidized Si wafers. Multilayers of Co/Pt/Co/B2O3 are deposited followed by appropriate thermal processing. The as-deposited films are disordered fcc CoPt phase, and magnetically soft. After annealing, an (001) orientation of CoPt-ordered grains is developed. The texture development is dependent both on the total film thickness and the annealing process. Nearly perfect (001) texture can be obtained in films with thinner initial layer thicknesses. Strong perpendicular anisotropy is shown to be related to this (001) texture.",

author = "Yan, {M. L.} and N. Powers and Sellmyer, {D. J.}",

year = "2002",

doi = "10.1557/proc-721-e7.6",

language = "English (US)",

volume = "721",

pages = "291--295",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

publisher = "Materials Research Society",

note = "Magnetic and Electronic Films - Microstructure, Texture and Application to Data Storage ; Conference date: 01-04-2002 Through 04-04-2002",

}

TY - JOUR

T1 - Non-epitaxial, highly textured (001) CoPt:B2O3 composite films for perpendicular recording

AU - Yan, M. L.

AU - Powers, N.

AU - Sellmyer, D. J.

PY - 2002

Y1 - 2002

N2 - We report the non-epitaxial growth of highly textured (001) CoPt:B2O3 nanocomposite thin films that are deposited directly on thermally-oxidized Si wafers. Multilayers of Co/Pt/Co/B2O3 are deposited followed by appropriate thermal processing. The as-deposited films are disordered fcc CoPt phase, and magnetically soft. After annealing, an (001) orientation of CoPt-ordered grains is developed. The texture development is dependent both on the total film thickness and the annealing process. Nearly perfect (001) texture can be obtained in films with thinner initial layer thicknesses. Strong perpendicular anisotropy is shown to be related to this (001) texture.

AB - We report the non-epitaxial growth of highly textured (001) CoPt:B2O3 nanocomposite thin films that are deposited directly on thermally-oxidized Si wafers. Multilayers of Co/Pt/Co/B2O3 are deposited followed by appropriate thermal processing. The as-deposited films are disordered fcc CoPt phase, and magnetically soft. After annealing, an (001) orientation of CoPt-ordered grains is developed. The texture development is dependent both on the total film thickness and the annealing process. Nearly perfect (001) texture can be obtained in films with thinner initial layer thicknesses. Strong perpendicular anisotropy is shown to be related to this (001) texture.

UR - http://www.scopus.com/inward/record.url?scp=0036458050&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0036458050&partnerID=8YFLogxK

U2 - 10.1557/proc-721-e7.6

DO - 10.1557/proc-721-e7.6

M3 - Conference article

AN - SCOPUS:0036458050

SN - 0272-9172

VL - 721

SP - 291

EP - 295

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Magnetic and Electronic Films - Microstructure, Texture and Application to Data Storage

Y2 - 1 April 2002 through 4 April 2002

ER -

Non-epitaxial, highly textured (001) CoPt:B₂O₃ composite films for perpendicular recording

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this