TY - GEN
T1 - On-line sensing and visual feedback for Atomic Force Microscopy (AFM) based nano-manipulations
AU - Song, Bo
AU - Xi, Ning
AU - Yang, Ruiguo
AU - Lai, King Wai Chiu
AU - Qu, Chengeng
PY - 2010
Y1 - 2010
N2 - Atomic Force Microscopy (AFM) is a powerful and popular technique of single-molecule imaging both in air and liquid. Recent research and hardware development provide AFM with the function of manipulation nano-particle and modify sample surface in nano-scale. However, due to AFM usually takes several minutes to get an image and the surface change is hard to observe in real-time manipulation. In this paper, a novel approach for on-line sensing and display method is proposed and used for updating the surface change during the manipulation of cell. In this approach a cutting force detection model is used for cutting depth judgment. In addition, an adaptive local-scan strategy is involved here to get the topography of the local surface. Finally a display model is used to update the change of the surface during the manipulation. With this novel scheme the process of cell cutting become real-time visualized. So, AFM tip could work as an efficient nanolithography or cutting tool.
AB - Atomic Force Microscopy (AFM) is a powerful and popular technique of single-molecule imaging both in air and liquid. Recent research and hardware development provide AFM with the function of manipulation nano-particle and modify sample surface in nano-scale. However, due to AFM usually takes several minutes to get an image and the surface change is hard to observe in real-time manipulation. In this paper, a novel approach for on-line sensing and display method is proposed and used for updating the surface change during the manipulation of cell. In this approach a cutting force detection model is used for cutting depth judgment. In addition, an adaptive local-scan strategy is involved here to get the topography of the local surface. Finally a display model is used to update the change of the surface during the manipulation. With this novel scheme the process of cell cutting become real-time visualized. So, AFM tip could work as an efficient nanolithography or cutting tool.
UR - http://www.scopus.com/inward/record.url?scp=78751555868&partnerID=8YFLogxK
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U2 - 10.1109/NMDC.2010.5651906
DO - 10.1109/NMDC.2010.5651906
M3 - Conference contribution
AN - SCOPUS:78751555868
SN - 9781424488964
T3 - 2010 IEEE Nanotechnology Materials and Devices Conference, NMDC2010
SP - 71
EP - 74
BT - 2010 IEEE Nanotechnology Materials and Devices Conference, NMDC2010
T2 - 2010 4th IEEE Nanotechnology Materials and Devices Conference, NMDC2010
Y2 - 12 October 2010 through 15 October 2010
ER -