Optical- and magneto-optical measurements using a variable angle of incidence spectroscopic ellipsometer: Application to DyCo multilayers

William A. McGahan, Z. S. Shan, Alan M. Massengale, Thomas E. Tiwald, John A. Woollam

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

We have extended the technique of variable angle spectroscopic ellipsometry to measurement of the magneto-optical effects as a function of wavelength and angle of incidence and field strength. Results on DyCo multilayers are reported.

Original languageEnglish (US)
Pages (from-to)1271-1272
Number of pages2
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume7
Issue number3
DOIs
StatePublished - May 1989

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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