Abstract
The index of refraction and extinction coefficient are measured as a function of wavelength from 254 to 633 nm using reflection-null ellipsometry. It is shown that both rf glow-discharge-deposited and ion-beam-sputtered films have the same values of n and k over the measured wavelength range. Calculated values of absorption coefficient indicate that the absorption edge is not reached even at near ultraviolet wavelengths. Thermal cycling up to 500°C does not change the optical properties significantly.
Original language | English (US) |
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Pages (from-to) | 7229-7235 |
Number of pages | 7 |
Journal | Physical Review B |
Volume | 28 |
Issue number | 12 |
DOIs | |
State | Published - 1983 |
Externally published | Yes |
ASJC Scopus subject areas
- Condensed Matter Physics