Oscillatory behavior (with a period of about 9nm) of antiferromagnetic coupling with the thicknesses of Cu and Zr underlayers is reported for sputtered Co(1 nm)/Cu(2.3 nm) multilayers. The related oscillation of magnetoresistance is also observed. Based on the analysis of X-ray diffraction patterns, the variation of crystallographic orientation and modulation period is proved not responsible to the phenomenon. But the underlayer strongly affects the growth orientation of multilayer.
|Original language||English (US)|
|Number of pages||5|
|State||Published - Aug 1998|
ASJC Scopus subject areas
- Physics and Astronomy(all)