Abstract
Metal thin-film deposition, over the Cr2O3 surface of CrO2 thin-film substrates, exhibits a redox reaction at the interface. The transition metal forms an oxide in combination with the reduction of the near-surface chromium oxide to Cr2O3. The insulating barrier layer Cr2O3 increases with the formation of Pb3O4 in Pb/Cr2O 3/CrO2 and CoO in Co/Cr2O3/CrO 2 junctions, respectively.
Original language | English (US) |
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Pages (from-to) | 2109-2111 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 81 |
Issue number | 11 |
DOIs | |
State | Published - Sep 9 2002 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)