Pattern matching by scan-converting polygons

Mingtian Ni, Stephen E. Reichenbach

Research output: Contribution to journalConference articlepeer-review

4 Scopus citations


Pattern matching is one of the well-known pattern recognition techniques. When using points as matching features, a pattern matching problem becomes a point pattern matching problem. This paper proposes a novel point pattern matching algorithm that searches transformation space by transformation sampling. The algorithm defines a constraint set (a polygonal region in transformation space) for each possible pairing of a template point and a target point. Under constrained polynomial transformations that have no more than two parameters on each coordinate, the constraint sets and the transformation space can be represented as Cartesian products of 2D polygonal regions. The algorithm then rasterizes the transformation space into a discrete canvas and calculates the optimal matching at each sampled transformation efficiently by scan-converting polygons. Preliminary experiments on randomly generated point patterns show that the algorithm is effective and efficient. In addition, the running time of the algorithm is stable with respect to missing points.

Original languageEnglish (US)
Pages (from-to)101-110
Number of pages10
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - 2004
Externally publishedYes
EventVisual Information Processing XIII - Orlando, FL, United States
Duration: Apr 15 2004Apr 16 2004


  • Geometric constraint
  • Point pattern matching
  • Scan-converting polygon
  • Transformation sampling

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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