Peak pattern variations related to comprehensive two-dimensional gas chromatography acquisition

Mingtian Ni, Stephen E. Reichenbach, Arvind Visvanathan, Joel TerMaat, Edward B. Ledford

Research output: Contribution to journalArticlepeer-review

28 Scopus citations


Identifying compounds of interest for peaks in data generated by comprehensive two-dimensional gas chromatography (GC × GC) is a critical analytical task. Manually identifying compounds is tedious and time-consuming. An alternative is to use pattern matching. Pattern matching identifies compounds by matching previously observed patterns with known peaks to newly observed patterns with unidentified peaks. The fundamental difficulty of pattern matching comes from peak pattern distortions that are caused by differences in data acquisition conditions. This paper investigates peak pattern variations related to varying oven temperature ramp rate and inlet gas pressure and evaluates two types of affine transformations for matching peak patterns. The experimental results suggest that, over the experimental ranges, the changes in temperature ramp rate generate non-linear pattern variations and changes in gas pressure generate nearly linear pattern variations. The results indicate the affine transformations can largely remove the pattern variations and can be used for applications such as pattern matching and normalizing retention times to retention indices.

Original languageEnglish (US)
Pages (from-to)165-170
Number of pages6
JournalJournal of Chromatography A
Issue number1-2
StatePublished - Sep 9 2005


  • Compound identification
  • Comprehensive two-dimensional gas chromatography (GC x GC)
  • Peak pattern matching
  • Peak pattern variation
  • Transformation model

ASJC Scopus subject areas

  • Analytical Chemistry
  • Biochemistry
  • Organic Chemistry


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