Polaron and phonon properties in proton intercalated amorphous tungsten oxide thin films

M. F. Saenger, T. Höing, B. W. Robertson, R. B. Billa, T. Hofmann, E. Schubert, M. Schubert

Research output: Contribution to journalArticle

37 Scopus citations

Abstract

We report on the evolution of the polaron and phonon mode properties in amorphous tungsten oxide thin films measured by spectroscopic ellipsometry in the infrared to ultraviolet spectral regions as a function of the intercalated proton density. A parametric physical model dielectric function is presented, which excellently describes the ellipsometry data over a large intercalated charge-density range. Upon increased amounts of intercalated charge we observe a strong increase in the polaron absorption in the visible spectral range, a decrease in the infrared W-O bond polarity, and an increase in the W=O bond polarity. Our findings support the oxygen-extraction model as the polaron formation mechanism in tungsten oxide in agreement with previous theoretical works based on first-principles pseudopotential calculations. We discuss and suggest polaron formation by oxygen-related defect generation as origin for the coloration mechanism in tungsten oxide. We further discuss possible evidence for very large effective mass of the polarons within the insulator-to-metal transition regime.

Original languageEnglish (US)
Article number245205
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume78
Issue number24
DOIs
StatePublished - Dec 1 2008

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Polaron and phonon properties in proton intercalated amorphous tungsten oxide thin films'. Together they form a unique fingerprint.

Cite this