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Progresses in carbon nitride synthesis by pulsed laser deposition
Z. M. Ren, Y. F. Lu, Z. F. He
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Article
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peer-review
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Mathematics
Pulsed Laser Deposition
100%
Nitrides
81%
Carbon
59%
Thin Films
58%
Backscattering
47%
Nitrogen
46%
Synthesis
42%
Substrate
36%
Electron
32%
Pulsed Laser
31%
Excimer Laser
30%
X-ray Spectroscopy
30%
Atomic Force Microscope
29%
Raman Spectroscopy
29%
Ellipsometry
29%
Infrared Spectroscopy
27%
Electronic Properties
26%
Time-of-flight
25%
Optical Properties
24%
Graphite
23%
Microscope
22%
Crystal Structure
21%
Materials Science
21%
Scanning
19%
High Energy
19%
Wavelength
17%
Diffraction
17%
Crystal
16%
Fourier transform
13%
Target
13%
Derivative
9%
Standards
8%
Engineering & Materials Science
Pulsed laser deposition
72%
Carbon nitride
67%
Thin films
44%
Microscopes
30%
Rutherford backscattering spectroscopy
29%
Nitrogen
29%
Ellipsometry
26%
Excimer lasers
24%
Electronic properties
24%
Ion beams
22%
Substrates
22%
Pulsed lasers
21%
Infrared spectroscopy
21%
Raman spectroscopy
20%
Electron diffraction
20%
Crystal structure
20%
Optical properties
19%
Materials science
19%
X ray photoelectron spectroscopy
19%
Electrons
15%
Graphite
15%
Crystals
15%
Fourier transforms
15%
Deposits
15%
Ions
14%
Wavelength
13%
Derivatives
12%
Scanning
12%
Physics & Astronomy
carbon nitrides
61%
pulsed laser deposition
44%
synthesis
33%
backscattering
27%
microscopes
24%
thin films
24%
nitrogen ions
19%
materials science
17%
excimer lasers
15%
ellipsometry
15%
light emission
14%
optical spectrum
14%
deposits
14%
infrared spectroscopy
14%
emission spectra
13%
pulsed lasers
13%
graphite
13%
Raman spectroscopy
13%
electron diffraction
13%
photoelectron spectroscopy
12%
crystal structure
12%
ion beams
12%
spectrometers
11%
nitrogen
11%
optical properties
10%
scanning
9%
electronics
8%
crystals
7%
wavelengths
7%
ions
7%
x rays
7%
electrons
6%
energy
4%
Chemical Compounds
Pulsed Laser Deposition
61%
Oxalonitrile
50%
Time-of-Flight Mass Spectra (TOFMS)
25%
Backscattering
22%
Fourier Transform Raman Spectroscopy
21%
Rutherford Backscattering Spectroscopy
20%
Nitrogen
18%
Ion Beam
17%
Ellipsometry
17%
Excimer
17%
Electron Diffraction
15%
Tunneling
15%
Emission Spectrum
13%
Electronic Property
12%
Graphite
11%
Optical Property
11%
Wavelength
11%
X-Ray Photoelectron Spectroscopy
10%
Amorphous Material
10%
Force
10%
Electron Particle
8%
Crystal Structure
7%
Energy
7%