Rapid, artifact-reduced, image reconstruction for super-resolution structured illumination microscopy

Zhaojun Wang, Tianyu Zhao, Yanan Cai, Jingxiang Zhang, Huiwen Hao, Yansheng Liang, Shaowei Wang, Yujie Sun, Tongsheng Chen, Piero R. Bianco, Kwangsung Oh, Ming Lei

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Engineering & Materials Science