Remanence Enhancement and Exchange Coupling in PrCo/Co Films

J. P. Liu; Y. Liu; Z. S. Shan; D. J. Sellmyer

doi:10.1109/20.619546

Remanence Enhancement and Exchange Coupling in PrCo/Co Films

J. P. Liu, Y. Liu, Z. S. Shan, D. J. Sellmyer

Physics and Astronomy

Research output: Contribution to journal › Article › peer-review

16 Scopus citations

Abstract

-PrCo/Co multilayer thin films have been prepared by sputtering. After heat treatment, high coercivity is developed and the remanence is enhanced for the insertion of the Co layers and the exchange coupling between the hard phase and the soft phase, which leads to high energy products of the composite magnets. The nanostructure of the films has been studied by TEM. It is found that the grain size of the films with high energy products is in the range from 10 to 25 nanometers. I

Original language	English (US)
Pages (from-to)	3709-3711
Number of pages	3
Journal	IEEE Transactions on Magnetics
Volume	33
Issue number	5 PART 2
DOIs	https://doi.org/10.1109/20.619546
State	Published - 1997

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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title = "Remanence Enhancement and Exchange Coupling in PrCo/Co Films",

abstract = "-PrCo/Co multilayer thin films have been prepared by sputtering. After heat treatment, high coercivity is developed and the remanence is enhanced for the insertion of the Co layers and the exchange coupling between the hard phase and the soft phase, which leads to high energy products of the composite magnets. The nanostructure of the films has been studied by TEM. It is found that the grain size of the films with high energy products is in the range from 10 to 25 nanometers. I",

author = "Liu, {J. P.} and Y. Liu and Shan, {Z. S.} and Sellmyer, {D. J.}",

note = "Funding Information: J. P. Liu, 402-472-2682, fax 402-472-2879, [email protected]. This work was supported by the US Department of Energy under grants DoE/ANL-95-47DH407 and DOE-DE-F602-86ER45262.",

year = "1997",

doi = "10.1109/20.619546",

language = "English (US)",

volume = "33",

pages = "3709--3711",

journal = "IEEE Transactions on Magnetics",

issn = "0018-9464",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "5 PART 2",

}

TY - JOUR

T1 - Remanence Enhancement and Exchange Coupling in PrCo/Co Films

AU - Liu, J. P.

AU - Liu, Y.

AU - Shan, Z. S.

AU - Sellmyer, D. J.

N1 - Funding Information: J. P. Liu, 402-472-2682, fax 402-472-2879, [email protected]. This work was supported by the US Department of Energy under grants DoE/ANL-95-47DH407 and DOE-DE-F602-86ER45262.

PY - 1997

Y1 - 1997

N2 - -PrCo/Co multilayer thin films have been prepared by sputtering. After heat treatment, high coercivity is developed and the remanence is enhanced for the insertion of the Co layers and the exchange coupling between the hard phase and the soft phase, which leads to high energy products of the composite magnets. The nanostructure of the films has been studied by TEM. It is found that the grain size of the films with high energy products is in the range from 10 to 25 nanometers. I

AB - -PrCo/Co multilayer thin films have been prepared by sputtering. After heat treatment, high coercivity is developed and the remanence is enhanced for the insertion of the Co layers and the exchange coupling between the hard phase and the soft phase, which leads to high energy products of the composite magnets. The nanostructure of the films has been studied by TEM. It is found that the grain size of the films with high energy products is in the range from 10 to 25 nanometers. I

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JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

IS - 5 PART 2

ER -

Remanence Enhancement and Exchange Coupling in PrCo/Co Films

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