Scanning acoustic microscopy with vector contrast

W. Grill, K. Hillmann, T. J. Kim, O. Lenkeit, J. Ndop, M. Schubert

Research output: Contribution to journalConference articlepeer-review

13 Scopus citations

Abstract

Based on high resolution vector contrast involving the simultaneous detection of phase and amplitude a variety of novel schemes for scanning acoustic microscopy are presented. This includes high resolution topography of sample surfaces in the reflection mode, volume imaging by three dimensional scanning, holographic imaging of the transport properties of ultrasonic waves by surface focused transmission microscopy, thermal imaging by differential phase contrast, and acoustic near field microscopy performed in reflection at 1.2 GHz.

Original languageEnglish (US)
Pages (from-to)553-558
Number of pages6
JournalPhysica B: Condensed Matter
Volume263-264
DOIs
StatePublished - Mar 1999
Externally publishedYes
EventProceedings of the 1998 9th International Conference on Phonon Scattering in Condensed Matter, PHONONS 98 - Lancaster, Great Britain
Duration: Jul 26 1998Jul 31 1998

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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