Scanning electron microscope identification of weak links in superconducting thin films

Don Monroe, W. S. Brocklesby, R. C. Farrow, M. Hong, S. H. Liou

Research output: Contribution to journalArticle

10 Scopus citations

Abstract

We have used a pulsed electron beam in a scanning electron microscope to produce highly localized (∼1 μm) changes in the electrical properties of a heterogeneous thin film of YBa2Cu3O7-δ. The predominant effect of the beam is to locally heat the film, producing a measurable shift in the current-voltage characteristic. In particular, we have precisely located the part of the film responsible for a sharp feature in the current-voltage characteristic corresponding to a single Josephson junction. The technique should also be useful more generally in identifying specific weak links in superconducting thin films.

Original languageEnglish (US)
Pages (from-to)1210-1212
Number of pages3
JournalApplied Physics Letters
Volume53
Issue number13
DOIs
StatePublished - 1988

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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