Scanning the Issue

I. F. Akyildiz; M. Pierobon; S. Balasubramaniam; J. Zhang; T. Chen; S. Zhong; J. Wang; W. Zhang; X. Zuo; R. G. Maunder; L. Hanzo; J. Chen; J. Liu; V. D. Calhoun; A. B. Magoun

doi:10.1109/JPROC.2019.2913137

Scanning the Issue

I. F. Akyildiz, M. Pierobon, S. Balasubramaniam, J. Zhang, T. Chen, S. Zhong, J. Wang, W. Zhang, X. Zuo, R. G. Maunder, L. Hanzo, J. Chen, J. Liu, V. D. Calhoun, A. B. Magoun

Research output: Contribution to journal › Editorial › peer-review

Original language	English (US)
Article number	8710358
Pages (from-to)	866-867
Number of pages	2
Journal	Proceedings of the IEEE
Volume	107
Issue number	5
DOIs	https://doi.org/10.1109/JPROC.2019.2913137
State	Published - May 2019

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/JPROC.2019.2913137

Cite this

@article{68eb3c967a974c34b675d837fdb680c2,

title = "Scanning the Issue",

author = "Akyildiz, {I. F.} and M. Pierobon and S. Balasubramaniam and J. Zhang and T. Chen and S. Zhong and J. Wang and W. Zhang and X. Zuo and Maunder, {R. G.} and L. Hanzo and J. Chen and J. Liu and Calhoun, {V. D.} and Magoun, {A. B.}",

year = "2019",

month = may,

doi = "10.1109/JPROC.2019.2913137",

language = "English (US)",

volume = "107",

pages = "866--867",

journal = "Proceedings of the IEEE",

issn = "0018-9219",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "5",

}

TY - JOUR

T1 - Scanning the Issue

AU - Akyildiz, I. F.

AU - Pierobon, M.

AU - Balasubramaniam, S.

AU - Zhang, J.

AU - Chen, T.

AU - Zhong, S.

AU - Wang, J.

AU - Zhang, W.

AU - Zuo, X.

AU - Maunder, R. G.

AU - Hanzo, L.

AU - Chen, J.

AU - Liu, J.

AU - Calhoun, V. D.

AU - Magoun, A. B.

PY - 2019/5

Y1 - 2019/5

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U2 - 10.1109/JPROC.2019.2913137

DO - 10.1109/JPROC.2019.2913137

M3 - Editorial

AN - SCOPUS:85065621664

VL - 107

SP - 866

EP - 867

JO - Proceedings of the IEEE

JF - Proceedings of the IEEE

SN - 0018-9219

IS - 5

M1 - 8710358

ER -