Single-shot structural analysis by high-energy X-ray diffraction using an ultrashort all-optical source

R. Rakowski, G. Golovin, J. O'Neal, J. Zhang, P. Zhang, B. Zhao, M. D. Wilson, M. C. Veale, P. Seller, S. Chen, S. Banerjee, D. Umstadter, M. Fuchs

Research output: Contribution to journalArticlepeer-review

5 Scopus citations


High-energy X-rays (HEX-rays) with photon energies on order of 100 keV have attractive characteristics, such as comparably low absorption, high spatial resolution and the ability to access inner-shell states of heavy atoms. These properties are advantageous for many applications ranging from studies of bulk materials to the investigation of materials in extreme conditions. Ultrafast X-ray diffraction allows the direct imaging of atomic dynamics simultaneously on its natural time and length scale. However, using HEX-rays for ultrafast studies has been limited due to the lack of sources that can generate pulses of sufficiently short (femtosecond) duration in this wavelength range. Here we show single-crystal diffraction using ultrashort ~90 keV HEX-ray pulses generated by an all-optical source based on inverse Compton scattering. We also demonstrate a method for measuring the crystal lattice spacing in a single shot that contains only ~105 photons in a spectral bandwidth of ~50% full width at half maximum (FWHM). Our approach allows us to obtain structural information from the full X-ray spectrum. As target we use a cylindrically bent Ge crystal in Laue transmission geometry. This experiment constitutes a first step towards measurements of ultrafast atomic dynamics using femtosecond HEX-ray pulses.

Original languageEnglish (US)
Article number16603
JournalScientific reports
Issue number1
StatePublished - Dec 1 2017

ASJC Scopus subject areas

  • General


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