Single-shot structural analysis by high-energy X-ray diffraction using an ultrashort all-optical source

R. Rakowski, G. Golovin, J. O'Neal, J. Zhang, P. Zhang, B. Zhao, M. D. Wilson, M. C. Veale, P. Seller, S. Chen, S. Banerjee, D. Umstadter, M. Fuchs

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Fingerprint

Dive into the research topics of 'Single-shot structural analysis by high-energy X-ray diffraction using an ultrashort all-optical source'. Together they form a unique fingerprint.

Physics

Keyphrases