SmFe12 and SmFe12Nx films fabricated by sputtering

D. Wang; S. H. Liou; P. He; D. J. Sellmyer; G. C. Hadjipanayis; Y. Zhang

doi:10.1016/0304-8853(93)90070-I

SmFe₁₂ and SmFe₁₂N_x films fabricated by sputtering

D. Wang, S. H. Liou, P. He, D. J. Sellmyer, G. C. Hadjipanayis, Y. Zhang

Research output: Contribution to journal › Article › peer-review

44 Scopus citations

Abstract

DC magnetron sputtering has been used to fabricate SmFe₁₂ films with ThMn₁₂ type of tetragonal structure. SmFe₁₂N_x films were made by heating the sample in situ in a low pressure nitrogen atmosphere. The lattice parameters are a = 8.589 Å, C = 4.807 Å for SmFe₁₂ films and a = 8.735 Å, c = 4.895 Å for SmFe₁₂N_x films respectively, corr esponding to a volume increase of about 5.3% upon nitrogenation. A change of anisotropy and an increase of Curie temperature upon nitrogenation are observed. Aspects of crystal structure, texture and magnetic properties are reported.

Original language	English (US)
Pages (from-to)	62-68
Number of pages	7
Journal	Journal of Magnetism and Magnetic Materials
Volume	124
Issue number	1-2
DOIs	https://doi.org/10.1016/0304-8853(93)90070-I
State	Published - Jun 1 1993

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1016/0304-8853(93)90070-I

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@article{9d9275baeecf455598512fdbf09c2191,

title = "SmFe12 and SmFe12Nx films fabricated by sputtering",

abstract = "DC magnetron sputtering has been used to fabricate SmFe12 films with ThMn12 type of tetragonal structure. SmFe12Nx films were made by heating the sample in situ in a low pressure nitrogen atmosphere. The lattice parameters are a = 8.589 {\AA}, C = 4.807 {\AA} for SmFe12 films and a = 8.735 {\AA}, c = 4.895 {\AA} for SmFe12Nx films respectively, corr esponding to a volume increase of about 5.3% upon nitrogenation. A change of anisotropy and an increase of Curie temperature upon nitrogenation are observed. Aspects of crystal structure, texture and magnetic properties are reported.",

author = "D. Wang and Liou, {S. H.} and P. He and Sellmyer, {D. J.} and Hadjipanayis, {G. C.} and Y. Zhang",

note = "Funding Information: We are gratefult o Professor R. Kirby for help in XRD analysisW. e thank Professor S.S. Jaswal, Dr. Z.S. Shari, Dr. A. Nazareth, Dr. Y.Z. Wang and Mr. J.X. Shen for assistancea nd helpful discussions.W e are indebted to the U.S. DOE for financial support under grants DE-FG02-86ER45262a nd DE-FG02-86ER45263.",

year = "1993",

month = jun,

day = "1",

doi = "10.1016/0304-8853(93)90070-I",

language = "English (US)",

volume = "124",

pages = "62--68",

journal = "Journal of Magnetism and Magnetic Materials",

issn = "0304-8853",

publisher = "Elsevier B.V.",

number = "1-2",

}

TY - JOUR

T1 - SmFe12 and SmFe12Nx films fabricated by sputtering

AU - Wang, D.

AU - Liou, S. H.

AU - He, P.

AU - Sellmyer, D. J.

AU - Hadjipanayis, G. C.

AU - Zhang, Y.

N1 - Funding Information: We are gratefult o Professor R. Kirby for help in XRD analysisW. e thank Professor S.S. Jaswal, Dr. Z.S. Shari, Dr. A. Nazareth, Dr. Y.Z. Wang and Mr. J.X. Shen for assistancea nd helpful discussions.W e are indebted to the U.S. DOE for financial support under grants DE-FG02-86ER45262a nd DE-FG02-86ER45263.

PY - 1993/6/1

Y1 - 1993/6/1

N2 - DC magnetron sputtering has been used to fabricate SmFe12 films with ThMn12 type of tetragonal structure. SmFe12Nx films were made by heating the sample in situ in a low pressure nitrogen atmosphere. The lattice parameters are a = 8.589 Å, C = 4.807 Å for SmFe12 films and a = 8.735 Å, c = 4.895 Å for SmFe12Nx films respectively, corr esponding to a volume increase of about 5.3% upon nitrogenation. A change of anisotropy and an increase of Curie temperature upon nitrogenation are observed. Aspects of crystal structure, texture and magnetic properties are reported.

AB - DC magnetron sputtering has been used to fabricate SmFe12 films with ThMn12 type of tetragonal structure. SmFe12Nx films were made by heating the sample in situ in a low pressure nitrogen atmosphere. The lattice parameters are a = 8.589 Å, C = 4.807 Å for SmFe12 films and a = 8.735 Å, c = 4.895 Å for SmFe12Nx films respectively, corr esponding to a volume increase of about 5.3% upon nitrogenation. A change of anisotropy and an increase of Curie temperature upon nitrogenation are observed. Aspects of crystal structure, texture and magnetic properties are reported.

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U2 - 10.1016/0304-8853(93)90070-I

DO - 10.1016/0304-8853(93)90070-I

M3 - Article

AN - SCOPUS:0027607248

SN - 0304-8853

VL - 124

SP - 62

EP - 68

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

IS - 1-2

ER -

SmFe₁₂ and SmFe₁₂N_x films fabricated by sputtering

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