Spectroscopic ellipsometry and band structure of Si1-yCy alloys grown pseudomorphically on Si (001)

Stefan Zollner, Craig M. Herzinger, John A. Woollam, Subramanian S. Iyer, Adrian P. Powell, Karl Eberl

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Fingerprint

Dive into the research topics of 'Spectroscopic ellipsometry and band structure of Si1-yCy alloys grown pseudomorphically on Si (001)'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds

Physics & Astronomy