Spectroscopic ellipsometry studies of indium tin oxide and other flat panel display multilayer materials

John A. Woollam, W. A. McGaham, B. Johs

Research output: Contribution to journalArticlepeer-review

60 Scopus citations

Fingerprint

Dive into the research topics of 'Spectroscopic ellipsometry studies of indium tin oxide and other flat panel display multilayer materials'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science