Stress-induced frequency shifts in langasite thickness-mode resonators

John A. Kosinski; Robert A. Pastore; Xiaomeng Yang; Jiashi Yang; Joseph A. Turner

doi:10.1109/TUFFC.2009.1012

Stress-induced frequency shifts in langasite thickness-mode resonators

John A. Kosinski, Robert A. Pastore, Xiaomeng Yang, Jiashi Yang, Joseph A. Turner

Mechanical & Materials Engineering

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

In this paper, we report on our study of stressinduced effects on thickness vibrations of a langasite plate. The plate is assumed to be doubly rotated, specified by angles φ and θ. The stresses are assumed to be uniform and planar. The first-order perturbation integral as developed by Tiersten for frequency shifts in resonators is used. The dependence of frequency shifts on φ and θ is calculated and examined, and loci of stress-compensation are determined.

Original language	English (US)
Article number	4775271
Pages (from-to)	129-135
Number of pages	7
Journal	IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Volume	56
Issue number	1
DOIs	https://doi.org/10.1109/TUFFC.2009.1012
State	Published - Jan 2009

ASJC Scopus subject areas

Instrumentation
Acoustics and Ultrasonics
Electrical and Electronic Engineering

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AU - Turner, Joseph A.

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Stress-induced frequency shifts in langasite thickness-mode resonators

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