Stress-induced frequency shifts in langasite thickness-mode resonators

John A. Kosinski, Robert A. Pastore, Xiaomeng Yang, Jiashi Yang, Joseph A. Turner

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

In this paper, we report on our study of stressinduced effects on thickness vibrations of a langasite plate. The plate is assumed to be doubly rotated, specified by angles φ and θ. The stresses are assumed to be uniform and planar. The first-order perturbation integral as developed by Tiersten for frequency shifts in resonators is used. The dependence of frequency shifts on φ and θ is calculated and examined, and loci of stress-compensation are determined.

Original languageEnglish (US)
Article number4775271
Pages (from-to)129-135
Number of pages7
JournalIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Volume56
Issue number1
DOIs
StatePublished - Jan 2009

ASJC Scopus subject areas

  • Instrumentation
  • Acoustics and Ultrasonics
  • Electrical and Electronic Engineering

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