Stress-induced frequency shifts in langasite thickness-mode resonators

John A. Kosinski; Robert A. Pastore; Xiaomeng Yang; Jiashi Yang; Joseph A. Turner

doi:10.1109/TUFFC.2009.1012

Stress-induced frequency shifts in langasite thickness-mode resonators

John A. Kosinski, Robert A. Pastore, Xiaomeng Yang, Jiashi Yang, Joseph A. Turner

Mechanical & Materials Engineering

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

In this paper, we report on our study of stressinduced effects on thickness vibrations of a langasite plate. The plate is assumed to be doubly rotated, specified by angles φ and θ. The stresses are assumed to be uniform and planar. The first-order perturbation integral as developed by Tiersten for frequency shifts in resonators is used. The dependence of frequency shifts on φ and θ is calculated and examined, and loci of stress-compensation are determined.

Original language	English (US)
Article number	4775271
Pages (from-to)	129-135
Number of pages	7
Journal	IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Volume	56
Issue number	1
DOIs	https://doi.org/10.1109/TUFFC.2009.1012
State	Published - Jan 2009

ASJC Scopus subject areas

Instrumentation
Acoustics and Ultrasonics
Electrical and Electronic Engineering

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@article{d6bb0449801c4ada9f05ff02d0a93cce,

title = "Stress-induced frequency shifts in langasite thickness-mode resonators",

abstract = "In this paper, we report on our study of stressinduced effects on thickness vibrations of a langasite plate. The plate is assumed to be doubly rotated, specified by angles φ and θ. The stresses are assumed to be uniform and planar. The first-order perturbation integral as developed by Tiersten for frequency shifts in resonators is used. The dependence of frequency shifts on φ and θ is calculated and examined, and loci of stress-compensation are determined.",

author = "Kosinski, {John A.} and Pastore, {Robert A.} and Xiaomeng Yang and Jiashi Yang and Turner, {Joseph A.}",

year = "2009",

month = jan,

doi = "10.1109/TUFFC.2009.1012",

language = "English (US)",

volume = "56",

pages = "129--135",

journal = "IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control",

issn = "0885-3010",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "1",

}

TY - JOUR

T1 - Stress-induced frequency shifts in langasite thickness-mode resonators

AU - Kosinski, John A.

AU - Pastore, Robert A.

AU - Yang, Xiaomeng

AU - Yang, Jiashi

AU - Turner, Joseph A.

PY - 2009/1

Y1 - 2009/1

N2 - In this paper, we report on our study of stressinduced effects on thickness vibrations of a langasite plate. The plate is assumed to be doubly rotated, specified by angles φ and θ. The stresses are assumed to be uniform and planar. The first-order perturbation integral as developed by Tiersten for frequency shifts in resonators is used. The dependence of frequency shifts on φ and θ is calculated and examined, and loci of stress-compensation are determined.

AB - In this paper, we report on our study of stressinduced effects on thickness vibrations of a langasite plate. The plate is assumed to be doubly rotated, specified by angles φ and θ. The stresses are assumed to be uniform and planar. The first-order perturbation integral as developed by Tiersten for frequency shifts in resonators is used. The dependence of frequency shifts on φ and θ is calculated and examined, and loci of stress-compensation are determined.

UR - http://www.scopus.com/inward/record.url?scp=60349095218&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=60349095218&partnerID=8YFLogxK

U2 - 10.1109/TUFFC.2009.1012

DO - 10.1109/TUFFC.2009.1012

M3 - Article

C2 - 19213639

AN - SCOPUS:60349095218

VL - 56

SP - 129

EP - 135

JO - IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

JF - IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

SN - 0885-3010

IS - 1

M1 - 4775271

ER -