Symmetric quaternary phosphonium cation and perchlorate/chlorate anions: Crystal structure, Database study and Hirshfeld surface analysis

R. Salmasi, A. Salimi, M. Gholizadeh, M. Rahmani, J. C. Garrison

Research output: Contribution to journalArticle

3 Scopus citations

Abstract

Two new quaternary phosphonium salts of 1,2-ethandiylbis (triphenylphosphonium) Diperchlorate (I), 1,2-ethandiylbis (triphenylphosphonium) Dichlorate (II) were prepared and used for oxidation of different benzylic alcohols to afford their corresponding carbonyl compounds. These new compounds were characterized by IR, NMR spectroscopy and single crystal X-ray analysis. The crystal structure and Hirshfield surface analysis of titled compounds revealed that the change of accompanying anionic moiety can affect the directional interactions of CH⋯O hydrogen bonds between anionic and cationic units which lead to various supramolecular aggregations on the crystal packing. In order to exploring the influence of crystal environment of anionic moieties on the geometry of main symmetric cationic unit, the relative contribution of various close contacts and 2D fingerprint plots of title compounds and twenty three analogous structures retrieved from Cambridge Structural Database (CSD) were investigated through the distortion of tetrahedral coordination geometry of P center of main cationic unit based on τ 4 indices.

Original languageEnglish (US)
Pages (from-to)549-557
Number of pages9
JournalJournal of Molecular Structure
Volume1179
DOIs
StatePublished - Mar 5 2019

Keywords

  • Accompanying anions
  • Crystal structure analysis
  • Hirshfeld surface analysis
  • Oxidation agent
  • Quaternary phosphonium salt

ASJC Scopus subject areas

  • Analytical Chemistry
  • Spectroscopy
  • Organic Chemistry
  • Inorganic Chemistry

Fingerprint Dive into the research topics of 'Symmetric quaternary phosphonium cation and perchlorate/chlorate anions: Crystal structure, Database study and Hirshfeld surface analysis'. Together they form a unique fingerprint.

  • Cite this