Synthesis and characterization of highly textured Pt-Bi thin films

X. Z. Li, P. Kharel, V. R. Shah, D. J. Sellmyer

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

Pt-Bi films were synthesized on glass and thermally oxidized silicon substrates by e-beam evaporation and annealing. The structures were characterized using X-ray diffraction (XRD) and transmission electron microscopy/selected area electron diffraction (TEM/SAED) techniques. Single-phase PtBi was obtained at an annealing temperature of 300°C, whereas a higher annealing temperature of 400°C was required to obtain the highly textured γ-PtBi2 phase. TEM/SAED analysis showed that the films annealed at 400°C contain a dominant γ-PtBi2 phase with a small amount of γ-PtBi2 and γ-PtBi2 phases. Both the PtBi and γ-PtBi2 phases are highly textured in these two kinds of film: the c-axis of the hexagonal PtBi phase is mostly in the film plane, whereas the c-axis of the trigonal-PtBi2 phase is perpendicular to the film plane. The electrical resistivity of the film with the-PtBi2 phase was smaller by one order of magnitude than that of the film with the PtBi phase.

Original languageEnglish (US)
Pages (from-to)3406-3415
Number of pages10
JournalPhilosophical Magazine
Volume91
Issue number25
DOIs
StatePublished - Sep 1 2011

Keywords

  • Pt-Bi
  • TEM
  • XRD
  • electron diffraction
  • microstructure
  • resistivity
  • simulation
  • texture
  • thin film

ASJC Scopus subject areas

  • Condensed Matter Physics

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