Techniques for consecutive TEM and Atom probe tomography analysis of nanowires

D. R. Diercks, B. P. Gorman, C. L. Cheung, G. Wang

Research output: Contribution to journalArticle

23 Scopus citations
Original languageEnglish (US)
Pages (from-to)254-255
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
StatePublished - Jul 1 2009

ASJC Scopus subject areas

  • Instrumentation

Cite this