Techniques for consecutive TEM and Atom probe tomography analysis of nanowires

D. R. Diercks, B. P. Gorman, C. L. Cheung, G. Wang

Research output: Contribution to journalArticlepeer-review

25 Scopus citations
Original languageEnglish (US)
Pages (from-to)254-255
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Jul 2009

ASJC Scopus subject areas

  • Instrumentation

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