Abstract
Measurements are reported on the electrical resistivity of highly disordered Ni-Cr-Al films between 4.2 and 300 K. X-ray diffraction measurements show the films to be crystalline with a bcc structure. Negative temperature coefficients are observed and the resistivity data above about 50 K can be fitted by the expression (T)=0[1-cln(T2+2)], where depends on the heat treatment of the sample.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 5920-5921 |
| Number of pages | 2 |
| Journal | Physical Review B |
| Volume | 29 |
| Issue number | 10 |
| DOIs | |
| State | Published - 1984 |
ASJC Scopus subject areas
- Condensed Matter Physics