Temperature-dependent resistivity of highly disordered Ni-Cr-Al alloys

R. Hight, C. Plough, D. J. Sellmyer

Research output: Contribution to journalArticlepeer-review

3 Scopus citations


Measurements are reported on the electrical resistivity of highly disordered Ni-Cr-Al films between 4.2 and 300 K. X-ray diffraction measurements show the films to be crystalline with a bcc structure. Negative temperature coefficients are observed and the resistivity data above about 50 K can be fitted by the expression (T)=0[1-cln(T2+2)], where depends on the heat treatment of the sample.

Original languageEnglish (US)
Pages (from-to)5920-5921
Number of pages2
JournalPhysical Review B
Issue number10
StatePublished - 1984

ASJC Scopus subject areas

  • Condensed Matter Physics


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