Terahertz generalized Mueller-matrix ellipsometry

T. Hofmann; U. Schade; C. M. Herzinger; P. Esquinazi; M. Schubert

doi:10.1117/12.660382

Terahertz generalized Mueller-matrix ellipsometry

T. Hofmann, U. Schade, C. M. Herzinger, P. Esquinazi, M. Schubert

Electrical & Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Scopus citations

Abstract

We report on the first successful generalized Mueller-matrix ellipsometry measurements in the THz-frequency domain using the high-brilliance THz synchrotron radiation source IRIS at the electron storage ring BESSY, Germany. Generalized Ellipsometry, which is known as a powerful tool for measurement of optical constants including anisotropy and which was previously used in the FIR to VUV spectral range, is now employed for the first time to investigate condensed matter samples in the frequency range from 0.9 to 8 THz (30 to 650 cm ^-1). Exemplarily, results obtained from bound and unbound charge-carrier investigations in low-dimensional semi- and superconducting systems are presented. Future applications of this technique for investigation of charge-carrier dynamics in magnetic fields are envisioned.

Original language	English (US)
Title of host publication	Terahertz and Gigahertz Electronics and Photonics V
DOIs	https://doi.org/10.1117/12.660382
State	Published - 2006
Event	Terahertz and Gigahertz Electronics and Photonics V - San Jose, CA, United States Duration: Jan 25 2006 → Jan 26 2006

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	6120
ISSN (Print)	0277-786X

Other

Other	Terahertz and Gigahertz Electronics and Photonics V
Country/Territory	United States
City	San Jose, CA
Period	1/25/06 → 1/26/06

Keywords

Far infrared
Free-charge-carrier response
Generalized Mueller-matrix ellipsometry
Magnetooptic anisotropy
THz

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.660382

Cite this

Hofmann, T, Schade, U, Herzinger, CM, Esquinazi, P & Schubert, M 2006, Terahertz generalized Mueller-matrix ellipsometry. in Terahertz and Gigahertz Electronics and Photonics V., 61200D, Proceedings of SPIE - The International Society for Optical Engineering, vol. 6120, Terahertz and Gigahertz Electronics and Photonics V, San Jose, CA, United States, 1/25/06. https://doi.org/10.1117/12.660382

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title = "Terahertz generalized Mueller-matrix ellipsometry",

abstract = "We report on the first successful generalized Mueller-matrix ellipsometry measurements in the THz-frequency domain using the high-brilliance THz synchrotron radiation source IRIS at the electron storage ring BESSY, Germany. Generalized Ellipsometry, which is known as a powerful tool for measurement of optical constants including anisotropy and which was previously used in the FIR to VUV spectral range, is now employed for the first time to investigate condensed matter samples in the frequency range from 0.9 to 8 THz (30 to 650 cm -1). Exemplarily, results obtained from bound and unbound charge-carrier investigations in low-dimensional semi- and superconducting systems are presented. Future applications of this technique for investigation of charge-carrier dynamics in magnetic fields are envisioned.",

keywords = "Far infrared, Free-charge-carrier response, Generalized Mueller-matrix ellipsometry, Magnetooptic anisotropy, THz",

author = "T. Hofmann and U. Schade and Herzinger, {C. M.} and P. Esquinazi and M. Schubert",

year = "2006",

doi = "10.1117/12.660382",

language = "English (US)",

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series = "Proceedings of SPIE - The International Society for Optical Engineering",

booktitle = "Terahertz and Gigahertz Electronics and Photonics V",

note = "Terahertz and Gigahertz Electronics and Photonics V ; Conference date: 25-01-2006 Through 26-01-2006",

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TY - GEN

T1 - Terahertz generalized Mueller-matrix ellipsometry

AU - Hofmann, T.

AU - Schade, U.

AU - Herzinger, C. M.

AU - Esquinazi, P.

AU - Schubert, M.

PY - 2006

Y1 - 2006

N2 - We report on the first successful generalized Mueller-matrix ellipsometry measurements in the THz-frequency domain using the high-brilliance THz synchrotron radiation source IRIS at the electron storage ring BESSY, Germany. Generalized Ellipsometry, which is known as a powerful tool for measurement of optical constants including anisotropy and which was previously used in the FIR to VUV spectral range, is now employed for the first time to investigate condensed matter samples in the frequency range from 0.9 to 8 THz (30 to 650 cm -1). Exemplarily, results obtained from bound and unbound charge-carrier investigations in low-dimensional semi- and superconducting systems are presented. Future applications of this technique for investigation of charge-carrier dynamics in magnetic fields are envisioned.

AB - We report on the first successful generalized Mueller-matrix ellipsometry measurements in the THz-frequency domain using the high-brilliance THz synchrotron radiation source IRIS at the electron storage ring BESSY, Germany. Generalized Ellipsometry, which is known as a powerful tool for measurement of optical constants including anisotropy and which was previously used in the FIR to VUV spectral range, is now employed for the first time to investigate condensed matter samples in the frequency range from 0.9 to 8 THz (30 to 650 cm -1). Exemplarily, results obtained from bound and unbound charge-carrier investigations in low-dimensional semi- and superconducting systems are presented. Future applications of this technique for investigation of charge-carrier dynamics in magnetic fields are envisioned.

KW - Far infrared

KW - Free-charge-carrier response

KW - Generalized Mueller-matrix ellipsometry

KW - Magnetooptic anisotropy

KW - THz

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M3 - Conference contribution

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T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Terahertz and Gigahertz Electronics and Photonics V

T2 - Terahertz and Gigahertz Electronics and Photonics V

Y2 - 25 January 2006 through 26 January 2006

ER -

Terahertz generalized Mueller-matrix ellipsometry

Abstract

Publication series

Other

Keywords

ASJC Scopus subject areas

Access to Document

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