The results of transmission electron microscopy (TEM) and X-ray microanalysis of a (Hg,Tl)Ba2Ca2Cu3O8+x (1223) thin film on a LaAlO3 substrate are presented. The film was highly textured but polycrystalline, with c-axis oriented perpendicular to the substrate surface. The film/substrate interface was mostly sharp, but in some areas a 4-5 nm thick intermediate layer, of the (Hg,Tl)Ba2Ca1Cu2O6+x (1212) phase and an amorphous phase, was observed. CuOx, BaCuO2 and Ca-rich precipitates were found in the film. The intergrowth of other members of (Hg,Tl)-Ba-Ca-Cu-O compound family, in the form of stacking faults and ordered structures, were found to be common. Microstructural evidence suggested that texture was induced by surface energy/growth anisotropy, and initiated at the substrate surface more than at the free surface.
- Thin films
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering