The microstructure of (Hg,Tl) -based high temperature superconducting films on LaAlO3 substrates

A. L. Vasiliev, E. P. Kvam, F. Foong, S. H. Liou

Research output: Contribution to journalArticle

3 Scopus citations

Abstract

The results of transmission electron microscopy (TEM) and X-ray microanalysis of a (Hg,Tl)Ba2Ca2Cu3O8+x (1223) thin film on a LaAlO3 substrate are presented. The film was highly textured but polycrystalline, with c-axis oriented perpendicular to the substrate surface. The film/substrate interface was mostly sharp, but in some areas a 4-5 nm thick intermediate layer, of the (Hg,Tl)Ba2Ca1Cu2O6+x (1212) phase and an amorphous phase, was observed. CuOx, BaCuO2 and Ca-rich precipitates were found in the film. The intergrowth of other members of (Hg,Tl)-Ba-Ca-Cu-O compound family, in the form of stacking faults and ordered structures, were found to be common. Microstructural evidence suggested that texture was induced by surface energy/growth anisotropy, and initiated at the substrate surface more than at the free surface.

Original languageEnglish (US)
Pages (from-to)181-192
Number of pages12
JournalPhysica C: Superconductivity and its applications
Volume269
Issue number3-4
DOIs
StatePublished - Oct 1 1996

Keywords

  • (Hg,Tl)-1223
  • EDS
  • HgBaCaCuO
  • Inclusions
  • TEM
  • Thin films

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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