Thz generalized ellipsometry characterization of highly-ordered three-dimensional nanostructures

Tino Hofmann, Daniel Schmidt, Mathias Schubert

Research output: Chapter in Book/Report/Conference proceedingChapter

2 Scopus citations

Abstract

Routine generalized ellipsometry measurements at terahertz (THz) frequencies have become available only very recently, and we present and discuss the application to highly-ordered three-dimensional nanostructure thin films. Such nanostructure thin films are obtained from glancing angle deposition, and consist of slanted columnar structures with high spatial coherence. The slanted columnar thin films reveal strong birefringence due to electronic coupling and screening phenomena. Despite their extreme smallness compared with the THz wavelengThequivalent, slanted columnar nanostructure thin films can be used as sensors for dielectric fluids in transmission or reflection geometries, where measurements can be made through the back side of THz-transparent substrates. We describe an anisotropic biaxial effective medium dielectric function approach which comprises structural, geometrical and constituent fraction information, and which enables quantitative analysis of THz generalized ellipsometry measurements. We further describe a frequencydomain generalized ellipsometer setup which incorporates backward wave oscillator sources.

Original languageEnglish (US)
Title of host publicationEllipsometry at the Nanoscale
PublisherSpringer Berlin Heidelberg
Pages411-428
Number of pages18
ISBN (Electronic)9783642339561
ISBN (Print)9783642339554
DOIs
StatePublished - Jan 1 2013

ASJC Scopus subject areas

  • Engineering(all)

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    Hofmann, T., Schmidt, D., & Schubert, M. (2013). Thz generalized ellipsometry characterization of highly-ordered three-dimensional nanostructures. In Ellipsometry at the Nanoscale (pp. 411-428). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-642-33956-1