TY - GEN
T1 - Ultra-compliant thermal AFM probes for studying of cellular properties
AU - Lai, King Wai Chiu
AU - Gaitas, Angelo
AU - Yang, Ruiguo
AU - Fung, Carmen Kar Man
AU - Xi, Ning
PY - 2010
Y1 - 2010
N2 - Atomic force microscopy (AFM) can be used for a number of nanoscale biological studies. It opens the possibility to monitor cellular processes in physiological conditions with the ability to perform high resolution imaging and force measurements. However, analysis of the mechanical property of the living cells is difficult and the sensitivity is low. Conventional AFM probes use high-stiffness materials and therefore, it makes the force measurement on soft samples becoming more difficult. In this work an ultra-compliant AFM probe made of polyimide was used to provide an improved imaging and force measurement of cancer cells. The probe includes an embedded sensing element for thermal conductance characterization. The probe was used for thermal conductance and topographical mapping of biological cells. The probe allows for high speed imaging of cells in liquids.
AB - Atomic force microscopy (AFM) can be used for a number of nanoscale biological studies. It opens the possibility to monitor cellular processes in physiological conditions with the ability to perform high resolution imaging and force measurements. However, analysis of the mechanical property of the living cells is difficult and the sensitivity is low. Conventional AFM probes use high-stiffness materials and therefore, it makes the force measurement on soft samples becoming more difficult. In this work an ultra-compliant AFM probe made of polyimide was used to provide an improved imaging and force measurement of cancer cells. The probe includes an embedded sensing element for thermal conductance characterization. The probe was used for thermal conductance and topographical mapping of biological cells. The probe allows for high speed imaging of cells in liquids.
UR - http://www.scopus.com/inward/record.url?scp=79951846724&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=79951846724&partnerID=8YFLogxK
U2 - 10.1109/NANO.2010.5697767
DO - 10.1109/NANO.2010.5697767
M3 - Conference contribution
AN - SCOPUS:79951846724
SN - 9781424470334
T3 - 2010 10th IEEE Conference on Nanotechnology, NANO 2010
SP - 369
EP - 372
BT - 2010 10th IEEE Conference on Nanotechnology, NANO 2010
T2 - 2010 10th IEEE Conference on Nanotechnology, NANO 2010
Y2 - 17 August 2010 through 20 August 2010
ER -