Ultrasmall-angle X-ray scattering analysis of photonic crystal structure

V. V. Abramova; A. S. Sinitskii; N. A. Grigor'Eva; S. V. Grigor'Ev; D. V. Belov; A. V. Petukhov; A. A. Mistonov; A. V. Vasil'Eva; Yu D. Tret'Yakov

doi:10.1134/S1063776109070048

Ultrasmall-angle X-ray scattering analysis of photonic crystal structure

V. V. Abramova, A. S. Sinitskii, N. A. Grigor'Eva, S. V. Grigor'Ev, D. V. Belov, A. V. Petukhov, A. A. Mistonov, A. V. Vasil'Eva, Yu D. Tret'Yakov

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14 Scopus citations

Abstract

The results of an ultrasmall-angle X-ray scattering study of iron(III) oxide inverse opal thin films are presented. The photonic crystals examined are shown to have fcc structure with amount of stacking faults varying among the samples. The method used in this study makes it possible to easily distinguish between samples with predominantly twinned fcc structure and nearly perfect fcc stacking. The difference observed between samples fabricated under identical conditions is attributed to random layer stacking in the self-assembled colloidal crystals used as templates for fabricating the inverse opals. The present method provides a versatile tool for analyzing photonic crystal structure in studies of inverse opals made of various materials, colloidal crystals, and three-dimensional photonic crystals of other types.

Original language	English (US)
Pages (from-to)	29-34
Number of pages	6
Journal	Journal of Experimental and Theoretical Physics
Volume	109
Issue number	1
DOIs	https://doi.org/10.1134/S1063776109070048
State	Published - Jul 2009
Externally published	Yes

ASJC Scopus subject areas

General Physics and Astronomy

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@article{adcbff5f06034acf89db641cca07c2eb,

title = "Ultrasmall-angle X-ray scattering analysis of photonic crystal structure",

abstract = "The results of an ultrasmall-angle X-ray scattering study of iron(III) oxide inverse opal thin films are presented. The photonic crystals examined are shown to have fcc structure with amount of stacking faults varying among the samples. The method used in this study makes it possible to easily distinguish between samples with predominantly twinned fcc structure and nearly perfect fcc stacking. The difference observed between samples fabricated under identical conditions is attributed to random layer stacking in the self-assembled colloidal crystals used as templates for fabricating the inverse opals. The present method provides a versatile tool for analyzing photonic crystal structure in studies of inverse opals made of various materials, colloidal crystals, and three-dimensional photonic crystals of other types.",

author = "Abramova, {V. V.} and Sinitskii, {A. S.} and Grigor'Eva, {N. A.} and Grigor'Ev, {S. V.} and Belov, {D. V.} and Petukhov, {A. V.} and Mistonov, {A. A.} and Vasil'Eva, {A. V.} and Tret'Yakov, {Yu D.}",

note = "Funding Information: This work was supported by the Russian Founda tion for Basic Research, project nos. 07 03 92113 and 08 03 00938; under State Contracts 02.513.11.3185, 02.513.11.3186, and 02.513.11.3352; and by Presid ium of the Russian Academy of Sciences under the Program for Basic Research. We thank The Nether lands Organisation for Scientific Research (NWO) for the access provided to a synchrotron X ray beamline and K. Kvashnin and D. Detollenaere, station staff members of the Dutch–Belgian Beam Line (ESRF DUBBLE), for assistance in the synchrotron X ray experiment.",

year = "2009",

month = jul,

doi = "10.1134/S1063776109070048",

language = "English (US)",

volume = "109",

pages = "29--34",

journal = "Journal of Experimental and Theoretical Physics",

issn = "1063-7761",

publisher = "Pleiades Publishing",

number = "1",

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TY - JOUR

T1 - Ultrasmall-angle X-ray scattering analysis of photonic crystal structure

AU - Abramova, V. V.

AU - Sinitskii, A. S.

AU - Grigor'Eva, N. A.

AU - Grigor'Ev, S. V.

AU - Belov, D. V.

AU - Petukhov, A. V.

AU - Mistonov, A. A.

AU - Vasil'Eva, A. V.

AU - Tret'Yakov, Yu D.

N1 - Funding Information: This work was supported by the Russian Founda tion for Basic Research, project nos. 07 03 92113 and 08 03 00938; under State Contracts 02.513.11.3185, 02.513.11.3186, and 02.513.11.3352; and by Presid ium of the Russian Academy of Sciences under the Program for Basic Research. We thank The Nether lands Organisation for Scientific Research (NWO) for the access provided to a synchrotron X ray beamline and K. Kvashnin and D. Detollenaere, station staff members of the Dutch–Belgian Beam Line (ESRF DUBBLE), for assistance in the synchrotron X ray experiment.

PY - 2009/7

Y1 - 2009/7

N2 - The results of an ultrasmall-angle X-ray scattering study of iron(III) oxide inverse opal thin films are presented. The photonic crystals examined are shown to have fcc structure with amount of stacking faults varying among the samples. The method used in this study makes it possible to easily distinguish between samples with predominantly twinned fcc structure and nearly perfect fcc stacking. The difference observed between samples fabricated under identical conditions is attributed to random layer stacking in the self-assembled colloidal crystals used as templates for fabricating the inverse opals. The present method provides a versatile tool for analyzing photonic crystal structure in studies of inverse opals made of various materials, colloidal crystals, and three-dimensional photonic crystals of other types.

AB - The results of an ultrasmall-angle X-ray scattering study of iron(III) oxide inverse opal thin films are presented. The photonic crystals examined are shown to have fcc structure with amount of stacking faults varying among the samples. The method used in this study makes it possible to easily distinguish between samples with predominantly twinned fcc structure and nearly perfect fcc stacking. The difference observed between samples fabricated under identical conditions is attributed to random layer stacking in the self-assembled colloidal crystals used as templates for fabricating the inverse opals. The present method provides a versatile tool for analyzing photonic crystal structure in studies of inverse opals made of various materials, colloidal crystals, and three-dimensional photonic crystals of other types.

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Ultrasmall-angle X-ray scattering analysis of photonic crystal structure

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