Ultrasonic flaw detection for two-phase Ti-6Al-4V based on secondary scattering

Yingdong Fu, Ping Hu, Joseph A. Turner, Yongfeng Song, Xiongbing Li

Research output: Contribution to journalArticlepeer-review

10 Scopus citations


Ultrasonic inspection of two-phase Ti-6Al-4V materials is enhanced using a more complex microstructure model within the doubly-scattered response (DSR) limit. The new model is used to calculate the corresponding bounds of grain noise and these bounds are then used to define a time-dependent threshold for ultrasonic testing. A Ti-6Al-4V specimen with flat bottom holes is manufactured for ultrasonic measurements to verify the measurement sensitivity to sub-wavelength flaws. The experimental results show that the present method has obvious advantages over traditional methods associated with a fixed threshold as well as the time-dependent threshold based on the singly-scattered response (SSR). This work provides an effective tool for distinguishing sub-wavelength flaws from grain noise, thereby limiting both false positives and missed detections.

Original languageEnglish (US)
Pages (from-to)199-206
Number of pages8
JournalNDT and E International
StatePublished - Mar 2019


  • Double scattering
  • Hexagonal grains
  • Sub-wavelength flaws
  • Two-phase Ti-6Al-4V materials
  • Ultrasonic testing

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics
  • Mechanical Engineering


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