Abstract
Recently, a repeatable and scalable nanoscale electro-machining (nano-EM) process to produce sub-20 nm scale features has been demonstrated. In the presented research, the behavior of the liquid dielectric (n-decane) machining medium in nano-confinement (<3 nm) under physical boundary conditions is investigated using molecular dynamics (MD) simulation. Results show a four-fold increase in the density of n-decane indicating 'quasi-solid' behavior at the nano-EM interface, thereby acting as an effective charge transport medium between the nano-tool and the workpiece. The effect of such quasi-solid medium is demonstrated through the experimental observations of electrical breakdown (BD) at the sub-20 nm scale interface.
Original language | English (US) |
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Pages (from-to) | 199-202 |
Number of pages | 4 |
Journal | CIRP Annals - Manufacturing Technology |
Volume | 57 |
Issue number | 1 |
DOIs | |
State | Published - 2008 |
Keywords
- Electrical discharge machining
- Nanoscale electrical breakdown
- Simulation
ASJC Scopus subject areas
- Mechanical Engineering
- Industrial and Manufacturing Engineering