UV-vis-infrared optical and AFM study of spin-cast chitosan films

W. H. Nosal; D. W. Thompson; L. Yan; S. Sarkar; A. Subramanian; J. A. Woollam

doi:10.1016/j.colsurfb.2004.08.022

UV-vis-infrared optical and AFM study of spin-cast chitosan films

W. H. Nosal, D. W. Thompson, L. Yan, S. Sarkar, A. Subramanian, J. A. Woollam

Research output: Contribution to journal › Article › peer-review

33 Scopus citations

Abstract

Optical properties of spin-cast chitosan films have been determined in the infrared, visible, and ultraviolet region of the spectrum using spectroscopic ellipsometry. Optical constants for the UV-vis-near IR spectra from 130 to 1700 nm were determined using Cauchy dispersion forms combined with Lorentzian oscillator models in the absorptive shorter wavelength regions. Infrared index of refraction and extinction coefficients from 750 to 4000 cm^-1 were determined using ellipsometric data fits to dispersion models based on harmonic oscillators. This modeling determined that optical anisotropy was present and measurable over all wavelength regions of ellipsometric data. To obtain information on the micro- and nano-scale surface structure, tapping mode atomic force microscopy (AFM) imaging was employed to determine morphology and roughness information of dry spin-cast chitosan films.

Original language	English (US)
Pages (from-to)	131-137
Number of pages	7
Journal	Colloids and Surfaces B: Biointerfaces
Volume	43
Issue number	3-4
DOIs	https://doi.org/10.1016/j.colsurfb.2004.08.022
State	Published - Jul 10 2005

Keywords

AFM
Biocompatibility
Chitin/chitosan
Ellipsometry
Infrared spectra
Spectroscopy
Ultraviolet
Visible

ASJC Scopus subject areas

Biotechnology
Surfaces and Interfaces
Physical and Theoretical Chemistry
Colloid and Surface Chemistry

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10.1016/j.colsurfb.2004.08.022

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title = "UV-vis-infrared optical and AFM study of spin-cast chitosan films",

abstract = "Optical properties of spin-cast chitosan films have been determined in the infrared, visible, and ultraviolet region of the spectrum using spectroscopic ellipsometry. Optical constants for the UV-vis-near IR spectra from 130 to 1700 nm were determined using Cauchy dispersion forms combined with Lorentzian oscillator models in the absorptive shorter wavelength regions. Infrared index of refraction and extinction coefficients from 750 to 4000 cm-1 were determined using ellipsometric data fits to dispersion models based on harmonic oscillators. This modeling determined that optical anisotropy was present and measurable over all wavelength regions of ellipsometric data. To obtain information on the micro- and nano-scale surface structure, tapping mode atomic force microscopy (AFM) imaging was employed to determine morphology and roughness information of dry spin-cast chitosan films.",

keywords = "AFM, Biocompatibility, Chitin/chitosan, Ellipsometry, Infrared spectra, Spectroscopy, Ultraviolet, Visible",

author = "Nosal, {W. H.} and Thompson, {D. W.} and L. Yan and S. Sarkar and A. Subramanian and Woollam, {J. A.}",

note = "Funding Information: Special thanks are given to Corey Bungay of J.A. Woollam Company for acquiring the VUV-VASE data used in this work, Tom Tiwald for editorial comments, the U.S. Army Contract number W911NF-04-2-0011, and the College of Engineering and Technology at the University of Nebraska at Lincoln for financial support. ",

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doi = "10.1016/j.colsurfb.2004.08.022",

language = "English (US)",

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T1 - UV-vis-infrared optical and AFM study of spin-cast chitosan films

AU - Nosal, W. H.

AU - Thompson, D. W.

AU - Yan, L.

AU - Sarkar, S.

AU - Subramanian, A.

AU - Woollam, J. A.

N1 - Funding Information: Special thanks are given to Corey Bungay of J.A. Woollam Company for acquiring the VUV-VASE data used in this work, Tom Tiwald for editorial comments, the U.S. Army Contract number W911NF-04-2-0011, and the College of Engineering and Technology at the University of Nebraska at Lincoln for financial support.

PY - 2005/7/10

Y1 - 2005/7/10

N2 - Optical properties of spin-cast chitosan films have been determined in the infrared, visible, and ultraviolet region of the spectrum using spectroscopic ellipsometry. Optical constants for the UV-vis-near IR spectra from 130 to 1700 nm were determined using Cauchy dispersion forms combined with Lorentzian oscillator models in the absorptive shorter wavelength regions. Infrared index of refraction and extinction coefficients from 750 to 4000 cm-1 were determined using ellipsometric data fits to dispersion models based on harmonic oscillators. This modeling determined that optical anisotropy was present and measurable over all wavelength regions of ellipsometric data. To obtain information on the micro- and nano-scale surface structure, tapping mode atomic force microscopy (AFM) imaging was employed to determine morphology and roughness information of dry spin-cast chitosan films.

AB - Optical properties of spin-cast chitosan films have been determined in the infrared, visible, and ultraviolet region of the spectrum using spectroscopic ellipsometry. Optical constants for the UV-vis-near IR spectra from 130 to 1700 nm were determined using Cauchy dispersion forms combined with Lorentzian oscillator models in the absorptive shorter wavelength regions. Infrared index of refraction and extinction coefficients from 750 to 4000 cm-1 were determined using ellipsometric data fits to dispersion models based on harmonic oscillators. This modeling determined that optical anisotropy was present and measurable over all wavelength regions of ellipsometric data. To obtain information on the micro- and nano-scale surface structure, tapping mode atomic force microscopy (AFM) imaging was employed to determine morphology and roughness information of dry spin-cast chitosan films.

KW - AFM

KW - Biocompatibility

KW - Chitin/chitosan

KW - Ellipsometry

KW - Infrared spectra

KW - Spectroscopy

KW - Ultraviolet

KW - Visible

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ER -

UV-vis-infrared optical and AFM study of spin-cast chitosan films

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Keywords

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